Satisfy All Your
High Speed Load Simulation Needs
The PEL-2004A and PEL-2002A are multiple channel,
programmable DC electronic loads with a modularized structure. The
PEL-2000A Series is designed to meet the continuing shift toward
high speed operation in today's semiconductor market. As the power
supply units, DC-DC converters, and batteries that drive
semiconductor circuits to follow this shift, power supply design,
quality inspection, and characteristic certification using
high-speed performance loads have become necessary.
The PEL-2000A Series includes two types of mainframes and 4 types of
load modules to accommodate users' requirements in a flexible
manner. Any load module combination can be used with a mainframe to
tailor a test system based on the number of channels, and the
maximum load power, voltage and current of each channel. Multiple
loads can be connected in parallel to provide a higher-power load to
test higher power supply outputs. This flexibility significantly
reduces the investment needed for future projects that have
different power requirements. The PEL-2004A is a 4-slot mainframe
with a master control unit to hold 4 load modules, while PEL-2002A
is a 2-slot mainframe with master control unit to hold 2 load
modules. When the PEL-2004A is configured with 4 load modules rated
at 350W each, the PEL-2000A series is able to sink up to 1.4kVA of
power.
For higher load capacities, mainframes can be linked together in
parallel with standard MIL 20-pin connectors. A maximum of 5
mainframes, including one master and 4 slaves can be chained
together to create a total load capacity of
7kW for high current and high power applications. Using 4 dual channel load modules, the PEL-2004A is able to test 8 power supply outputs simultaneously. The Sequence function allows each channel to change its load sink according to a predefined sequence at a rate of up to 100 s per step.
Satisfy All Your
High Speed Load Simulation Needs
The PEL-2004A and PEL-2002A are multiple channel, programmable DC
electronic loads with a modularized structure. The PEL-2000A Series
is designed to meet the continuing shift toward high speed operation
in today's semiconductor market. As the power supply units, DC-DC
converters, and batteries that drive semiconductor circuits to
follow this shift, power supply design, quality inspection, and
characteristic certification using high-speed performance loads have
become necessary.
The PEL-2000A Series includes two types of mainframes and 4 types of
load modules to accommodate users' requirements in a flexible
manner. Any load module combination can be used with a mainframe to
tailor a test system based on the number of channels, and the
maximum load power, voltage and current of each channel. Multiple
loads can be connected in parallel to provide a higher-power load to
test higher power supply outputs. This flexibility significantly
reduces the investment needed for future projects that have
different power requirements. The PEL-2004A is a 4-slot mainframe
with a master control unit to hold 4 load modules, while PEL-2002A
is a 2-slot mainframe with master control unit to hold 2 load
modules. When the PEL-2004A is configured with 4 load modules rated
at 350W each, the PEL-2000A series is able to sink up to 1.4kVA of
power.
For higher load capacities, mainframes can be linked together in
parallel with standard MIL 20-pin connectors. A maximum of 5
mainframes, including one master and 4 slaves can be chained
together to create a total load capacity of 7kW for high current and
high power applications. Using 4 dual channel load modules, the
PEL-2004A is able to test 8 power supply outputs simultaneously. The
Sequence function allows each channel to change its load sink
according to a predefined sequence at a rate of up to 100 s per
step.
Each sequence is
able to run concurrently under the control of one clock. This is one
of the most powerful features of the PEL-2000A ASeries as it is able
to realistically simulate a multi-output power supply load. Under
Dynamic mode, the load current or load resistance pulses between two
preset levels at a pre-defined speed up to 25 s per step. This is
often used as the standard test procedure to verify the response of
a power supply to quick load changes. Most remarkably, multiple load
channels can be connected in parallel to run Dynamic tests
synchronously under a single clock. This Parallel Dynamic
functionality gives the flexibility to perform dynamic tests for a
high-power power supply without the need of another high-power load.
The PEL-2000A Series includes a number of protection modes: Over
Current Protection (OCP), Over Voltage Protection (OVP), Over Power
Protection (OPP), Reverse Voltage Protection (RVP), and Under
Voltage Protection(UVP). The protection modes are useful to protect
both the load modules and the DUT(s). A buzzer can be set when a
protection setting has been tripped. When a protection mode has been
tripped, the load unit will display an alarm and stop sinking
current/voltage. When a load unit is operating in CR or CV mode, the
unit may need Over Current Protection to prevent excessive current
being sunk. Over Current Protection stops the load from sinking more
current than its recommended limit and prevents the load from
burn-out damage.
Over Voltage Protection is used to limit the amount of voltage sink.
If the OVP trips, the PEL-2000A Series load will stop sinking
voltage. Over Power Protection is used when the input power exceeds
the specifications of the load. When OPP is tripped, the power will
cease to be sunk. Reverse Voltage Protection prevents reverse
voltage damage to the PEL-2000A Series up to the specified rating.
When Reverse Voltage Protection has been tripped, an alarm tone will
sound until the reverse voltage is removed. Under Voltage Protection
will turn off the load when the voltage drops below a set limit. The
Go/NoGo function is available to monitor test results all the time.
When a test result goes beyond a preset limit range, a "No Go"
indication will be shown on the display and a "No Go" signal can be
sent out through the D-SUB interface for external device control.
This Go/NoGo function is available for CC mode, CV mode, and CR
mode. Under "Program" mode, 12 programs, each containing 10 panel
setup memories, can be edited to create work routines for repetitive
tests. After a program has been executed, the results of all test
steps, along with the Go/NoGo judgments, will be shown on the
screen.
For external control and system configuration, the PEL-2000A series
has USB and RS-232 interfaces as standard and LAN as well as GPIB as
an option. The LabView driver and Data Logging PC software are both
supported for all the available interfaces. Each channel has an
analog control/monitoring connector on the rear panel to externally
turn a load on/off and to externally monitor load input current and
voltage.