Satisfy All Your
High Speed Load Simulation Needs
The PEL-2004B and PEL-2002B are multiple channel, programmable DC
electronic loads with a modularized structure. The PEL-2000B Series
is designed to meet the continuing shift toward high speed operation
in today's semiconductor market. As the power supply units, DC-DC
converters, and batteries that drive semiconductor circuits to
follow this shift, power supply design, quality inspection, and
characteristic certification using high-speed performance loads have
become necessary. The PEL-2000B Series includes two types of
mainframes and 4 types of load modules to accommodate users'
requirements in a flexible manner.
Any load module combination can be used with a mainframe to tailor a
test system based on the number of channels, and the maximum load
power, voltage and current of each channel. Multiple loads can be
connected in parallel to provide a higher-power load to test higher
power supply outputs. This flexibility significantly reduces the
investment needed for future projects that have different power
requirements. The PEL-2004B is a 4-slot mainframe with a master
control unit to hold 4 load modules, while PEL-2002B is a 2-slot
mainframe with master control unit to hold 2 load modules. When the
PEL-2004B is configured with 4 load modules rated at 350W each, the
PEL-2000B series is able to sink up to 1.4kVA of power.
For higher load capacities, mainframes can be linked together in
parallel with standard MIL 20-pin connectors. A maximum of 5
mainframes, including one master and 4 slaves can be chained
together to create a total load capacity of
7kW for high current and high power applications. Using 4 dual channel load modules, the PEL-2004B is able to test 8 power supply outputs simultaneously. The Sequence function allows each channel to change its load sink according to a predefined sequence at a rate of up to 100 s per step. Each sequence is able to run concurrently under the control of one clock. This is one of the most powerful features of the PEL-2000B ASeries as it is able to realistically simulate a multi-output power supply load. Under Dynamic mode, the load current or load resistance pulses between two preset levels at a pre-defined speed up to 25 s per step. This is often used as the standard test procedure to verify the response of a power supply to quick load changes. Most remarkably, multiple load channels can be connected in parallel to run Dynamic tests synchronously under a single clock. This Parallel Dynamic functionality gives the flexibility to perform dynamic tests for a high-power power supply without the need of another high-power load.
Satisfy All Your
High Speed Load Simulation Needs
The PEL-2004B and PEL-2002B are multiple channel, programmable DC
electronic loads with a modularized structure. The PEL-2000B Series
is designed to meet the continuing shift toward high speed operation
in today's semiconductor market. As the power supply units, DC-DC
converters, and batteries that drive semiconductor circuits to
follow this shift, power supply design, quality inspection, and
characteristic certification using high-speed performance loads have
become necessary. The PEL-2000B Series includes two types of
mainframes and 4 types of load modules to accommodate users'
requirements in a flexible manner.
Any load module combination can be used with a mainframe to tailor a
test system based on the number of channels, and the maximum load
power, voltage and current of each channel. Multiple loads can be
connected in parallel to provide a higher-power load to test higher
power supply outputs. This flexibility significantly reduces the
investment needed for future projects that have different power
requirements. The PEL-2004B is a 4-slot mainframe with a master
control unit to hold 4 load modules, while PEL-2002B is a 2-slot
mainframe with master control unit to hold 2 load modules. When the
PEL-2004B is configured with 4 load modules rated at 350W each, the
PEL-2000B series is able to sink up to 1.4kVA of power.
For higher load capacities, mainframes can be linked together in
parallel with standard MIL 20-pin connectors. A maximum of 5
mainframes, including one master and 4 slaves can be chained
together to create a total load capacity of 7kW for high current and
high power applications. Using 4 dual channel load modules, the
PEL-2004B is able to test 8 power supply outputs simultaneously. The
Sequence function allows each channel to change its load sink
according to a predefined sequence at a rate of up to 100 s per
step. Each sequence is able to run concurrently under the control of
one clock. This is one of the most powerful features of the
PEL-2000B ASeries as it is able to realistically simulate a
multi-output power supply load. Under Dynamic mode, the load current
or load resistance pulses between two preset levels at a pre-defined
speed up to 25 s per step. This is often used as the standard test
procedure to verify the response of a power supply to quick load
changes. Most remarkably, multiple load channels can be connected in
parallel to run Dynamic tests synchronously under a single clock.
This Parallel Dynamic functionality gives the flexibility to perform
dynamic tests for a high-power power supply without the need of
another high-power load.
The PEL-2000B
Series includes a number of protection modes: Over Current
Protection (OCP), Over Voltage Protection (OVP), Over Power
Protection (OPP), Reverse Voltage Protection (RVP), and Under
Voltage Protection(UVP). The protection modes are useful to protect
both the load modules and the DUT(s). A buzzer can be set when a
protection setting has been tripped. When a protection mode has been
tripped, the load unit will display an alarm and stop sinking
current/voltage. When a load unit is operating in CR or CV mode, the
unit may need Over Current Protection to prevent excessive current
being sunk. Over Current Protection stops the load from sinking more
current than its recommended limit and prevents the load from
burn-out damage. Over Voltage Protection is used to limit the amount
of voltage sink. If the OVP trips, the PEL-2000B Series load will
stop sinking voltage. Over Power Protection is used when the input
power exceeds the specifications of the load.
When OPP is tripped, the power will cease to be sunk. Reverse
Voltage Protection prevents reverse voltage damage to the PEL-2000B
Series up to the specified rating. When Reverse Voltage Protection
has been tripped, an alarm tone will sound until the reverse voltage
is removed. Under Voltage Protection will turn off the load when the
voltage drops below a set limit. The Go/NoGo function is available
to monitor test results all the time. When a test result goes beyond
a preset limit range, a "No Go" indication will be shown on the
display and a "No Go" signal can be sent out through the D-SUB
interface for external device control. This Go/NoGo function is
available for CC mode, CV mode, and CR mode. Under "Program" mode,
12 programs, each containing 10 panel setup memories, can be edited
to create work routines for repetitive tests.
After a program has been executed, the results of all test steps,
along with the Go/NoGo judgments, will be shown on the screen. For
external control and system configuration, the PEL-2000B series has
USB, RS-232/RS-485 and LAN interfaces as standard and as well as
GPIB as an option. The LabView driver and Data Logging PC software
are both supported for all the available interfaces. Each channel
has an analog control/monitoring connector on the rear panel to
externally turn a load on/off and to externally monitor load input
current and voltage.